Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects-Reference-Cited by-同舟云学术

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Reliability Analysis of a 130nm Charge Redistribution SAR ADC under Single Event Effects

Published:2014 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 27th Symposium on Integrated Circuits and Systems Design - SBCCI '14
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Author:

Lanot A. J. C.,Balen T. R.

Publisher

ACM Press

Reference18 articles.

1. A. Siska and M. He. (2010). Golden Gloves ADC Championship Match -- SAR vs. Sigma-Delta (ΣΔ). Available: http://www.cypress.com/?docID=22143

2. Cypress Semiconductor Corp. (2012). Cypress Perform. CY8C52 Family: datasheet. Available: www.cypress.com

3. Actel Corporation. (2012). SmartFusion cSoC Handbook: datasheet. Available: http://www.actel.com/products/smartfusion/

4. Texas Instruments Inc. (2012). MSP430F663x Mixed Signal Microcontroller. Available: http://www.ti.com/product/msp430f6638

5. M. Nicolaidis, Soft Errors in Modern Electronic Systems: Springer, 2010.

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Analysis of SAR ADC Performance Under Radiation Exposure;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03

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