Yield estimation of SRAM circuits using "Virtual SRAM Fab"-Reference-Cited by-同舟云学术

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Yield estimation of SRAM circuits using "Virtual SRAM Fab"

Published:2009 Issue: Volume: Page:
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Container-title:Proceedings of the 2009 International Conference on Computer-Aided Design - ICCAD '09
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Author:

Bansal Aditya,Nassif Sani,Heng Fook-Luen,Das Koushik K.,Singh Rama N.,Kanj Rouwaida N.,Mukhopadhyay Saibal,Lee Jin-Fuw,Acar Emrah,Singhee Amith,Kim Keunwoo,Chuang Ching-Te

Publisher

ACM Press

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. TinySPICE plus;Proceedings of the 35th International Conference on Computer-Aided Design;2016-11-07

2. Shape slack: a design-manufacturing co-optimization methodology using tolerance information;Journal of Micro/Nanolithography, MEMS, and MOEMS;2013-02-13

3. A Large $\sigma $V$_{\rm TH}$/VDD Tolerant Zigzag 8T SRAM With Area-Efficient Decoupled Differential Sensing and Fast Write-Back Scheme;IEEE Journal of Solid-State Circuits;2011-04

4. Lithographic variation aware design centering for SRAM yield enhancement;SPIE Proceedings;2011-03-17

5. Maximum-information storage system: Concept, implementation and application;2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD);2010-11

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