Integrated Power Signature Generation Circuit for IoT Abnormality Detection

Abstract

This work presents a methodology to monitor the power signature of IoT devices for detecting operation abnormality. It does not require bulky measurement equipment thanks to the proposed power signature generation circuit which can be integrated into LDO voltage regulators. The proposed circuit is implemented using a 130 nm CMOS technology and simulated with power trace measured from a wireless sensor. It shows the generated power signature accurately reflects the power consumption and can be used to distinguish different operation conditions, such as wireless transmission levels, data sampling rates and microcontroller UART communications.