Layout Decomposition with Pairwise Coloring and Adaptive Multi-Start for Triple Patterning Lithography

Author:

Zhang Ye1,Luk Wai-Shing1,Yang Yunfeng1,Zhou Hai2,Yan Changhao1,Pan David Z.3,Zeng Xuan1

Affiliation:

1. Fudan University, Shanghai, China

2. Northwestern University, Evanston, IL

3. University of Texas at Austin, Austin, TX

Abstract

In this article we present a pairwise coloring (PWC) approach to tackle the layout decomposition problem for triple patterning lithography (TPL). The main idea is to reduce the problem to a set of bi-coloring problems. The overall solution is refined by applying a bi-coloring method for pairs of color sets per pass. One obvious advantage of this method is that the existing double patterning lithography (DPL) techniques can be reused effortlessly. Moreover, we observe that each pass can be fulfilled efficiently by integrating an SPQR-tree-graph-division-based bi-coloring method. In addition, to prevent the solution getting stuck in the local minima, an adaptive multi-start (AMS) approach is incorporated. Adaptive starting points are generated according to the vote of previous solutions. The experimental results show that our method is competitive with other works on both solution quality and runtime performance.

Funder

National Natural Science Foundation of China

SRC

Shanghai Science and Technology Committee

NSF

National Basic Research Program of China

Publisher

Association for Computing Machinery (ACM)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Reference33 articles.

1. Complexity and Approximation

2. Kenneth D. Boese Andrew B. Kahng and Sudhakar Muddu. 1993. On the big valley and adaptive multi-start for discrete global optimizations. Tech. rep. TR-930 15. http://ftp.cs.ucla.edu/tech-report/1993-reports/930015.pdf. Kenneth D. Boese Andrew B. Kahng and Sudhakar Muddu. 1993. On the big valley and adaptive multi-start for discrete global optimizations. Tech. rep. TR-930 15. http://ftp.cs.ucla.edu/tech-report/1993-reports/930015.pdf.

3. A new adaptive multi-start technique for combinatorial global optimizations

4. SUALD: Spacing uniformity-aware layout decomposition in triple patterning lithography

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