Tackling signal electromigration with learning-based detection and multistage mitigation

Author:

Ye Wei1,Alawieh Mohamed Baker1,Lin Yibo1,Pan David Z.1

Affiliation:

1. UT Austin

Publisher

ACM

Reference22 articles.

1. J. Lienig "Electromigration and its impact on physical design in future technologies " in ACM International Symposium on Physical Design (ISPD) 2013 pp. 33--40. 10.1145/2451916.2451925 J. Lienig "Electromigration and its impact on physical design in future technologies " in ACM International Symposium on Physical Design (ISPD) 2013 pp. 33--40. 10.1145/2451916.2451925

2. Electromigration—A brief survey and some recent results

3. A. B. Kahng S. Nath and T. S. Rosing "On potential design impacts of electromigration awareness " in IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC) 2013 pp. 527--532. A. B. Kahng S. Nath and T. S. Rosing "On potential design impacts of electromigration awareness " in IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC) 2013 pp. 527--532.

4. "Addressing signal electromigration (EM) in today's complex digital designs " https://www.eetimes.com/document.asp?docid=1280370. "Addressing signal electromigration (EM) in today's complex digital designs " https://www.eetimes.com/document.asp?docid=1280370.

5. B. Li P. Muller J. Warnock L. Sigal and D. Badami "A case study of electromigration reliability: From design point to system operations " in IEEE International Reliability Physics Symposium (IRPS) 2015 pp. 2D.1.1--2D.1.6. B. Li P. Muller J. Warnock L. Sigal and D. Badami "A case study of electromigration reliability: From design point to system operations " in IEEE International Reliability Physics Symposium (IRPS) 2015 pp. 2D.1.1--2D.1.6.

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