Clafer tools for product line engineering

Author:

Antkiewicz Michał,Bąk Kacper,Murashkin Alexandr,Olaechea Rafael,Liang Jia Hui (Jimmy),Czarnecki Krzysztof

Publisher

ACM Press

Cited by 34 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Sampling Cardinality-Based Feature Models;Proceedings of the 18th International Working Conference on Variability Modelling of Software-Intensive Systems;2024-02-07

2. FeatRacer: Locating Features Through Assisted Traceability;IEEE Transactions on Software Engineering;2023-12

3. Generating Constraint Programs for Variability Model Reasoning: A DSL and Solver-Agnostic Approach;Proceedings of the 22nd ACM SIGPLAN International Conference on Generative Programming: Concepts and Experiences;2023-10-22

4. VEER: enhancing the interpretability of model-based optimizations;Empirical Software Engineering;2023-04-04

5. On the relation of variability modeling languages and non-functional properties;Proceedings of the 26th ACM International Systems and Software Product Line Conference - Volume B;2022-09-12

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