Research on write optimization of NVRAM memory management system based on decision tree and LSM-Tree
Author:
Affiliation:
1. State Grid Electric Power Research Institute (NARI Group Corporation), Nanjing, China
2. Information & Communication Company (SMPEC SHANGHAI), Shanghai, China
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/3419635.3419662
Reference13 articles.
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2. The missing memristor found
3. Lee Jun Gyu Kim Tae Whan. Effects of Grain Size on the Electrical Characteristics of Three-Dimensional NAND Flash Memory Devices. [J]. Journal of nanoscience and nanotechnology 2019 19 (10). Lee Jun Gyu Kim Tae Whan. Effects of Grain Size on the Electrical Characteristics of Three-Dimensional NAND Flash Memory Devices. [J]. Journal of nanoscience and nanotechnology 2019 19 (10).
4. NVRAM as Main Storage of Parallel File System [J];Malinowski Artur;Journal of Computer Science and Control Systems,2016
5. Better I/O through byte-addressable, persistent memory
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