Author:
Bron Arkady,Farchi Eitan,Magid Yonit,Nir Yarden,Ur Shmuel
Cited by
44 articles.
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1. WAFFLE: Exposing Memory Ordering Bugs Efficiently with Active Delay Injection;Proceedings of the Eighteenth European Conference on Computer Systems;2023-05-08
2. Generalized Coverage Criteria for Combinatorial Sequence Testing;IEEE Transactions on Software Engineering;2023
3. Concurrent behavioral coverage criteria for sequence diagrams;Innovations in Systems and Software Engineering;2021-11-25
4. GoAT: Automated Concurrency Analysis and Debugging Tool for Go;2021 IEEE International Symposium on Workload Characterization (IISWC);2021-11
5. RAProducer: efficiently diagnose and reproduce data race bugs for binaries via trace analysis;Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis;2021-07-11