A machine learning based hard fault recuperation model for approximate hardware accelerators-Reference-Cited by-同舟云学术

A machine learning based hard fault recuperation model for approximate hardware accelerators

Published:2018-06-24 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 55th Annual Design Automation Conference
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Author:

Taher Farah Naz¹,Callenes-Sloan Joseph²,Schafer Benjamin Carrion¹

Affiliation:

1. The University of Texas at Dallas

2. Cal Poly State University

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3195970.3195974

Reference27 articles.

1. M.-L. Li P. Ramachandran S. K. Sahoo S. V. Adve V. S. Adve and Y. Zhou "Trace-based Microarchitecture-level Diagnosis of Permanent Hardware Faults " in International Conference on Dependable Systems and Networks (DSN) 2008. M.-L. Li P. Ramachandran S. K. Sahoo S. V. Adve V. S. Adve and Y. Zhou "Trace-based Microarchitecture-level Diagnosis of Permanent Hardware Faults " in International Conference on Dependable Systems and Networks (DSN) 2008.

2. S. Borkar "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation " IEEE Micro 2005. 10.1109/MM.2005.110 S. Borkar "Designing Reliable Systems from Unreliable Components: The Challenges of Transistor Variability and Degradation " IEEE Micro 2005. 10.1109/MM.2005.110

3. M. Stanisavljević A. Schmid and Y. Leblebici "Reliability Faults and Fault Tolerance " in Reliability of Nanoscale Circuits and Systems 2011. M. Stanisavljević A. Schmid and Y. Leblebici "Reliability Faults and Fault Tolerance " in Reliability of Nanoscale Circuits and Systems 2011.

4. I. Koren and Z. Koren "Defect Tolerance in VLSI circuits: Techniques and Yield Analysis " Proceedings of the IEEE 1998. I. Koren and Z. Koren "Defect Tolerance in VLSI circuits: Techniques and Yield Analysis " Proceedings of the IEEE 1998.

5. Fault tolerance in VLSI circuits