Affiliation:
1. Indian Institute of Technology, L.I.T. Post Office, Kanpur, India
Abstract
Errata are given for “Efficient Planarity Testing” by John Hopcroft and Robert Tarjan [
J. ACM 21
, 4 (Oct. 1974), 549-568].
Publisher
Association for Computing Machinery (ACM)
Subject
Artificial Intelligence,Hardware and Architecture,Information Systems,Control and Systems Engineering,Software
Cited by
6 articles.
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