A Dynamic Learning Network for Steel Surface Inspection Based on Structural Re-parameterization-Reference-Cited by-同舟云学术

A Dynamic Learning Network for Steel Surface Inspection Based on Structural Re-parameterization

Published:2023-10-17 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 7th International Conference on Computer Science and Application Engineering
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Author:

Gao Shuo¹^ORCID,Hong Ge¹^ORCID,Xing Xueqi¹^ORCID,Han Dongyang¹^ORCID,Li Rourou¹^ORCID,Seidelmann Joachim²^ORCID,Xia Tangbin¹^ORCID

Affiliation:

1. SJTU-Fraunhofer Center, Shanghai Jiao Tong University, China

2. Fraunhofer Institute for Manufacturing Engineering and Automation, Germany

Funder

National Natural Science Foundation of China

Natural Science Foundation of Shanghai

National Key Research and Development Program of China

CSSC-SJTU Marine Equipment Forward Looking Innovation Foundation

Oceanic Interdisciplinary Program of Shanghai Jiao Tong University

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3627915.3629602

Reference26 articles.

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3. Chen T , Tian G.Y , Sophian A and Que P.W ( 2008 ). Feature Extraction and Selection for Defect Classification of Pulsed Eddy Current NDT NDT & E International 41 467 - 476 Chen T, Tian G.Y, Sophian A and Que P.W (2008). Feature Extraction and Selection for Defect Classification of Pulsed Eddy Current NDT NDT & E International 41 467-476

4. Liu Y , Xu K and Xu J ( 2019 ). An Improved MB-LBP Defect Recognition Approach for the Surface of Steel Plates Applied Sciences 9 4222 Liu Y, Xu K and Xu J (2019). An Improved MB-LBP Defect Recognition Approach for the Surface of Steel Plates Applied Sciences 9 4222

5. Liu K , Luo N , Li A , Tian Y , Sajid H and Chen H ( 2020 ). A New Self-Reference Image Decomposition Algorithm for Strip Steel Surface Defect Detection IEEE Transactions on Instrumentation and Measurement 69 4732-4741 Liu K, Luo N, Li A, Tian Y, Sajid H and Chen H (2020). A New Self-Reference Image Decomposition Algorithm for Strip Steel Surface Defect Detection IEEE Transactions on Instrumentation and Measurement 69 4732-4741