Improving test suites for efficient fault localization-Reference-Cited by-同舟云学术

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Improving test suites for efficient fault localization

Published:2006-05-28 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 28th international conference on Software engineering
language:
Short-container-title:

Author:

Baudry Benoit¹,Fleurey Franck¹,Le Traon Yves²

Affiliation:

1. IRISA, Cedex, France

2. France Télécom R&D, Cedex, France

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/1134285.1134299

Reference17 articles.

1. Fault localization using execution slices and dataflow tests

2. Automatic Test Case Optimization: A Bacteriologic Algorithm

3. Locating causes of program failures

4. Lightweight Defect Localization for Java

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