Age-based PCM wear leveling with nearly zero search cost

Author:

Chen Chi-Hao,Hsiu Pi-Cheng,Kuo Tei-Wei,Yang Chia-Lin,Wang Cheng-Yuan Michael

Publisher

ACM Press

Cited by 36 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Ensuring consistent recovery under power failure with minimal NVM write overhead;Journal of Systems Architecture;2024-03

2. MC-ELMM: Multi-Chip Endurance-Limited Memory Management;Proceedings of the International Symposium on Memory Systems;2023-10-02

3. ECC-Map: A Resilient Wear-Leveled Memory-Device Architecture with Low Mapping Overhead;Proceedings of the International Symposium on Memory Systems;2023-10-02

4. Effective Stack Wear Leveling for NVM;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-10

5. Rapid NVM Simulation and Analysis on Single Bit Granularity Featuring Gem5 and NVMain;2023 IEEE 12th Non-Volatile Memory Systems and Applications Symposium (NVMSA);2023-08

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