Directed test generation to detect loop inefficiencies-Reference-Cited by-同舟云学术

Directed test generation to detect loop inefficiencies

Published:2016-11 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 2016 24th ACM SIGSOFT International Symposium on Foundations of Software Engineering
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Author:

Dhok Monika¹,Ramanathan Murali Krishna¹

Affiliation:

1. Indian Institute of Science, India

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/2950290.2950360

Reference45 articles.

1. https://answers.acrobatusers.com/Performance-Issues-Acrobat-Reader-11-0-0-2-secure-mode-enabledq91247.aspx. https://answers.acrobatusers.com/Performance-Issues-Acrobat-Reader-11-0-0-2-secure-mode-enabledq91247.aspx.

2. https://bugs.eclipse.org/bugs/show bug.cgi?id=394078. https://bugs.eclipse.org/bugs/show bug.cgi?id=394078.

3. Efficient object sampling via weak references

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