Affiliation:
1. Panoramic Research, Inc., Palo Alto, California
Abstract
Some problems arising in multicategory (many pattern types) pattern recognition are treated mathematically, and formulas are derived which describe some inherent limitations associated therewith. The principal results concern the “dimensional” and “correlational” effects and their degradation of a multimeasurement recognition system.
Publisher
Association for Computing Machinery (ACM)
Subject
Artificial Intelligence,Hardware and Architecture,Information Systems,Control and Systems Engineering,Software
Reference6 articles.
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