An efficient, low-cost ECC approach for critical-application memories-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

An efficient, low-cost ECC approach for critical-application memories

Published:2017 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 30th Symposium on Integrated Circuits and Systems Design Chip on the Sands - SBCCI '17
language:
Short-container-title:

Author:

Silva Felipe¹,Lima Otávio²,Freitas Walter³,Vargas Fabian⁴,Silveira Jarbas⁵,Marcon César⁴

Affiliation:

1. LESC-DETI-Federal University of Ceará (UFC), Fortaleza, Brazil

2. LSD-Federal Institut of Ceará, Maracanaú, Brazil

3. GTEL-DETI-Federal University of Ceará (UFC), Fortaleza, Brazil

4. Catholic University of Rio Grande do Sul (PUC-RS), Porto Alegre, Brazil

5. LESC-DETI- Federal University of Ceará (UFC), Fortaleza, Brazil

Publisher

ACM Press

Reference20 articles.

1. P. Hazucha, C. Svensson. Impact of CMOS technology scaling on the atmospheric neutron soft error rate.IEEE Transaction on Nuclear Science, v. 47, n. 6, pp. 2586--2594, Dec. 2000.

2. K. LaBel, C. Barnes, C. Marshall, A. Johnston, R. Reed, J. Barth, C. Seidleck, S. Kayali, M. O'Bryan. A roadmap for NASA's radiation effects research in emerging microelectronics and photonics.IEEE Aerospace Conference, v. 5, pp. 535--545, 2000.

3. P. Ferreyra, C. Marques, R. Ferreyra, J. Gaspar. Failure map functions and accelerated mean time to failure tests: New approaches for improving the reliability estimation in systems exposed to single event upsets.IEEE Transaction on Nuclear Science, v. 52, n. 1, pp. 494--500, Feb. 2005.

4. V. Gherman, S. Evain, F. Auzanneau, Y. Bonhomme. Programmable extended SEC-DED codes for memory errors.IEEE VLSI Test Symposium (VTS), pp. 140--145, 2011.

5. D. Radaelli, H. Puchner, S. Wong, S. Daniel. Investigation of multibit upsets in a 150 nm technology SRAM device.IEEE Transaction on Nuclear Science, v. 52, n. 6, pp. 2433--2437, Dec. 2005.

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparing structures of two-dimensional error correction codes;Microelectronics Reliability;2024-10

2. Research on ECC Algorithm FPGA Acceleration Circuit for High Reliable AIoT System;2023 2nd Asian Conference on Frontiers of Power and Energy (ACFPE);2023-10-20

3. A Triple Burst Error Correction Based on Region Selection Code;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-08

4. A survey on two-dimensional Error Correction Codes applied to fault-tolerant systems;Microelectronics Reliability;2022-12

5. OPCoSA: an Optimized Product Code for space applications;Integration;2022-05

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3