On Characterizing Near-Threshold SRAM Failures in FinFET Technology-Reference-Cited by-同舟云学术

On Characterizing Near-Threshold SRAM Failures in FinFET Technology

Published:2017-06-18 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 54th Annual Design Automation Conference 2017
language:
Short-container-title:

Author:

Ganapathy Shrikanth¹,Kalamatianos John¹,Kasprak Keith²,Raasch Steven¹

Affiliation:

1. AMD Research, Advanced Micro Devices, Inc.

2. Cores Group, Advanced Micro Devices, Inc.

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3061639.3062292

Reference13 articles.

1. G. K. Chen D. Blaauw T. Mudge D. Sylvester and Nam Sung Kim. 2007. Yield-driven near-threshold SRAM design. In ICCAD. G. K. Chen D. Blaauw T. Mudge D. Sylvester and Nam Sung Kim. 2007. Yield-driven near-threshold SRAM design. In ICCAD.

2. Zeshan Chishti Alaa R Alameldeen Chris Wilkerson Wei Wu and Shih-Lien Lu. 2009. Improving cache lifetime reliability at ultra-low voltages. In MICRO. 10.1145/1669112.1669126 Zeshan Chishti Alaa R Alameldeen Chris Wilkerson Wei Wu and Shih-Lien Lu. 2009. Improving cache lifetime reliability at ultra-low voltages. In MICRO. 10.1145/1669112.1669126

3. Hadi Esmaeilzadeh Emily Blem Renee St Amant Karthikeyan Sankaralingam and Doug Burger. 2011. Dark silicon and the end of multicore scaling. In ISCA. 10.1145/2024723.2000108 Hadi Esmaeilzadeh Emily Blem Renee St Amant Karthikeyan Sankaralingam and Doug Burger. 2011. Dark silicon and the end of multicore scaling. In ISCA. 10.1145/2024723.2000108

4. S. Ganapathy R. Canal A. Gonzalez and A. Rubio. 2013. Effectiveness of hybrid recovery techniques on parametric failures. In ISQED. S. Ganapathy R. Canal A. Gonzalez and A. Rubio. 2013. Effectiveness of hybrid recovery techniques on parametric failures. In ISQED.

5. Samuel Karlin. 2014. A first course in stochastic processes. Academic press. Samuel Karlin. 2014. A first course in stochastic processes. Academic press.

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Improving the Performance Predictability of Faulty Data Caches;2024 19th European Dependable Computing Conference (EDCC);2024-04-08

2. BERRY: Bit Error Robustness for Energy-Efficient Reinforcement Learning-Based Autonomous Systems;2023 60th ACM/IEEE Design Automation Conference (DAC);2023-07-09

3. A Research Retrospective on AMD's Exascale Computing Journey;Proceedings of the 50th Annual International Symposium on Computer Architecture;2023-06-17

4. X-NVDLA: Runtime Accuracy Configurable NVDLA Based on Applying Voltage Overscaling to Computing and Memory Units;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-05

5. Random and Adversarial Bit Error Robustness: Energy-Efficient and Secure DNN Accelerators;IEEE Transactions on Pattern Analysis and Machine Intelligence;2023-03-01