1. A Hybrid Test Scheme for Automotive IC in Multisite Testing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022-12
2. VTS 2022 Steering and Program Committees;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25
3. Accurate Estimation of Test Pattern Counts for a Wide-Range of EDT Input/Output Channel Configurations;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25
4. Efficient Test Compression Configuration Selection;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2021
5. Decompressors using nonlinear codes;Microprocessors and Microsystems;2020-07