1. Generation of Two-Cycle Tests for Structurally Similar Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-02
2. Test Generation for an Iterative Design Flow with RTL Changes;2022 IEEE International Test Conference (ITC);2022-09
3. Fast Test Generation for Structurally Similar Circuits;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25
4. Design Methodology for MIMO Detection;Algorithms and VLSI Implementations of MIMO Detection;2022
5. Introduction;Algorithms and VLSI Implementations of MIMO Detection;2022