Statistical reliability analysis under process variation and aging effects
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ACM Press
Cited by 29 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Aging-Aware Critical Path Selection via Graph Attention Networks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-12
2. A Method Adopting Aging Corner to Improve the Accuracy of Device Aging Simulation Model;IEEE Transactions on Device and Materials Reliability;2023-09
3. Analog/RF Circuit Aging Prediction based on On-Chip Machine Learning;2023 6th International Conference on Artificial Intelligence and Big Data (ICAIBD);2023-05-26
4. A Learning-Based Method for Gate Delay Prediction under NBTI and Process Variation Effects;2023 International Symposium of Electronics Design Automation (ISEDA);2023-05-08
5. Gerabaldi: A Temporal Simulator for Probabilistic IC Degradation and Failure Processes;2023 IEEE 41st VLSI Test Symposium (VTS);2023-04-24
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