Design for low test pattern counts
Author:
Affiliation:
1. Broadcom Corporation, Irvine, CA
2. Mentor Graphics Corporation, Wilsonville, OR
3. Poznań University of Technology, Poznań, Poland
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/2744769.2744817
Reference21 articles.
1. Bushnell M. L. and Agrawal V. D. 2000. Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits Kluwer Academic Publishers. Bushnell M. L. and Agrawal V. D. 2000. Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits Kluwer Academic Publishers.
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