Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs-Reference-Cited by-同舟云学术

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Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs

Published:2014 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the The 51st Annual Design Automation Conference on Design Automation Conference - DAC '14
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Author:

Chen Yu-Guang,Wang Tao,Lai Kuan-Yu,Wen Wan-Yu,Shi Yiyu,Chang Shih-Chieh

Publisher

ACM Press

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comparing voltage adaptation performance between replica and in-situ timing monitors;Proceedings of the International Conference on Computer-Aided Design;2018-11-05

2. ePlace-3D;Proceedings of the 2016 on International Symposium on Physical Design;2016-04-03

3. Q-Learning Based Dynamic Voltage Scaling for Designs with Graceful Degradation;Proceedings of the 2015 Symposium on International Symposium on Physical Design;2015-03-29

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