Software visualization and deep transfer learning for effective software defect prediction-Reference-Cited by-同舟云学术

Software visualization and deep transfer learning for effective software defect prediction

Published:2020-06-27 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the ACM/IEEE 42nd International Conference on Software Engineering
language:
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Author:

Chen Jinyin¹,Hu Keke¹,Yu Yue²,Chen Zhuangzhi¹,Xuan Qi¹,Liu Yi¹,Filkov Vladimir³

Affiliation:

1. Zhejiang University of Technology, Hangzhou, China

2. National University of Defense Technology, Hefei, China

3. University of California

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3377811.3380389

Reference76 articles.

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2. On the relative value of cross-company and within-company data for defect prediction

3. Which process metrics can significantly improve defect prediction models? An empirical study

4. Automatically identifying code features for software defect prediction: Using AST N-grams

5. Perceptions, Expectations, and Challenges in Defect Prediction

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