When Face Completion Meets Irregular Holes: An Attributes Guided Deep Inpainting Network-Reference-Cited by-同舟云学术

When Face Completion Meets Irregular Holes: An Attributes Guided Deep Inpainting Network

Published:2021-10-17 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 29th ACM International Conference on Multimedia
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Author:

Xiao Jie¹,Zhan Dandan¹,Qi Haoran¹,Jin Zhi²

Affiliation:

1. Sun Yat-Sen University, Shenzhen, China

2. Sun Yat-Sen University & Guangdong Provincial Key Laboratory of Fire Science and Technology, Shenzhen, China

Funder

National Natural Science Foundation of China

Shenzhen Science and Technology Program

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3474085.3475466

Reference35 articles.

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2. Rong-Chi Chang Yun-Long Sie Su-Mei Chou and Timothy K Shih. 2005. Photo defect detection for image inpainting. In ISM. 5--pp. Rong-Chi Chang Yun-Long Sie Su-Mei Chou and Timothy K Shih. 2005. Photo defect detection for image inpainting. In ISM. 5--pp.

3. Region filling and object removal by exemplar-based image inpainting;Criminisi Antonio;TIP,2004

4. Kun Duan Devi Parikh David Crandall and Kristen Grauman. 2012. Discovering localized attributes for fine-grained recognition. In CVPR. 3474--3481. Kun Duan Devi Parikh David Crandall and Kristen Grauman. 2012. Discovering localized attributes for fine-grained recognition. In CVPR. 3474--3481.

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