SEU fault evaluation and characteristics for SRAM-based FPGA architectures and synthesis algorithms

Author:

Jing Naifeng1,Lee Ju-Yueh2,Feng Zhe2,He Weifeng1,Mao Zhigang1,He Lei2

Affiliation:

1. Shanghai Jiao Tong University

2. University of California, Los Angeles

Abstract

Reliability has become an increasingly important concern for SRAM-based field programmable gate arrays (FPGAs). Targeting SEU (single event upset) in SRAM-based FPGAs, this article first develops an SEU evaluation framework that can quantify the failure sensitivity for each configuration bit during design time. This framework considers detailed fault behavior and logic masking on a post-layout FPGA application and performs logic simulation on various circuit elements for fault evaluation. Applying this framework on MCNC benchmark circuits, we first characterize SEUs with respect to different FPGA circuits and architectures, for example, bidirectional routing and unidirectional routing. We show that in both routing architectures, interconnects not only contribute to the lion's share of the SEU-induced functional failures, but also present higher failure rates per configuration bits than LUTs. Particularly, local interconnect multiplexers in logic blocks have the highest failure rate per configuration bit. Then, we evaluate three recently proposed SEU mitigation algorithms, IPD, IPF, and IPV, which are all logic resynthesis-based with little or no overhead on placement and routing. Different fault mitigating capabilities at the chip level are revealed, and it demonstrates that algorithms with explicit consideration for interconnect significantly mitigate the SEU at the chip level, for example, IPV achieves 61% failure rate reduction on average against IPF with about 15%. In addition, the combination of the three algorithms delivers over 70% failure rate reduction on average at the chip level. The experiments also reveal that in order to improve fault tolerance at the chip level, it is necessary for future fault mitigation algorithms to concern not only LUT or interconnect faults, but also their interactions. We envision that our framework can be used to cast more useful insights for more robust FPGA circuits, architectures, and better synthesis algorithms.

Funder

Ministry of Science and Technology of the People's Republic of China

Publisher

Association for Computing Machinery (ACM)

Subject

Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications

Reference26 articles.

1. Soft error rate estimation and mitigation for SRAM-based FPGAs

2. Soft Error Susceptibility Analysis of SRAM-Based FPGAs in High-Performance Information Systems

3. Chapman K. 2010. SEU strategies for Virtex-5 devices. Chapman K. 2010. SEU strategies for Virtex-5 devices.

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Criticality-Aware Negotiation-Driven Scrubbing Scheduling for Reliability Maximization in SRAM-Based FPGAs;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

2. A Survey on Fault-Tolerance Methods for SRAM-Based FPGAs in Radiation Environments;2023 IEEE 32nd Asian Test Symposium (ATS);2023-10-14

3. Understanding fault-tolerance vulnerabilities in advanced SoC FPGAs for critical applications;Microelectronics Reliability;2023-07

4. Memristor Based FPGAs: Understanding the Effect of Configuration Memory Faults;Architecture of Computing Systems;2022

5. Mitigation of Soft Errors in Implantable Medical Devices;2020 7th International Conference on Electrical and Electronics Engineering (ICEEE);2020-04

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3