Improving student performance using automated testing of simulated digital logic circuits-Reference-Cited by-同舟云学术

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Improving student performance using automated testing of simulated digital logic circuits

Published:2008 Issue: Volume: Page:
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Container-title:Proceedings of the 13th annual conference on Innovation and technology in computer science education - ITiCSE '08
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Author:

Kurmas Zachary

Publisher

ACM Press

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. DLUnit: A Unit Testing Framework for Simulated Digital Logic Circuits;2023 IEEE Frontiers in Education Conference (FIE);2023-10-18

2. Mastery-Based Learning in Undergraduate Computer Architecture;2021 ACM/IEEE Workshop on Computer Architecture Education (WCAE);2021-06-17

3. Automatic Evaluation of Analog Circuit Designs;Lecture Notes on Data Engineering and Communications Technologies;2020-06-18

4. MIPSUnit;Proceedings of the 2017 ACM SIGCSE Technical Symposium on Computer Science Education;2017-03-08

5. MIPSUnit;Proceedings of the 46th ACM Technical Symposium on Computer Science Education;2015-02-24

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