eDRAM-based tiered-reliability memory with applications to low-power frame buffers

Author:

Cho Kyungsang1,Lee Yongjun2,Oh Young H.3,Hwang Gyoo-cheol4,Lee Jae W.3

Affiliation:

1. Samsung Electronics, Sungkyunkwan University, Hawseong, South Korea

2. Samsung Electronics, Sungkyunkwan University, Hwaseong, South Korea

3. Sungkyunkwan University, Suwon, South Korea

4. Samsung Electronics, Hwaseong, South Korea

Publisher

ACM

Reference35 articles.

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3. Samsung Analyst Day 2013: Display trends. http://www.samsung.com/. Samsung Analyst Day 2013: Display trends. http://www.samsung.com/.

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5. A soft error robust and power aware memory design

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