eDRAM-based tiered-reliability memory with applications to low-power frame buffers-Reference-Cited by-同舟云学术

eDRAM-based tiered-reliability memory with applications to low-power frame buffers

Published:2014-08-11 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 2014 international symposium on Low power electronics and design
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Author:

Cho Kyungsang¹,Lee Yongjun²,Oh Young H.³,Hwang Gyoo-cheol⁴,Lee Jae W.³

Affiliation:

1. Samsung Electronics, Sungkyunkwan University, Hawseong, South Korea

2. Samsung Electronics, Sungkyunkwan University, Hwaseong, South Korea

3. Sungkyunkwan University, Suwon, South Korea

4. Samsung Electronics, Hwaseong, South Korea

Publisher

ACM

Link

Reference35 articles.

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