1. On the acceleration of test generation algorithms;Shimono Fujiwara;IEEE Transactions on Computers
2. A Two-Variable Model for SAT-Based ATPG
3. J. Silva and K. Sakallah , " Robust search algorithms for test pattern generation," in Proceedings of IEEE 27th International Symposium on Fault Tolerant Computing , 1997 , pp. 152 -- 161 . J. Silva and K. Sakallah, "Robust search algorithms for test pattern generation," in Proceedings of IEEE 27th International Symposium on Fault Tolerant Computing, 1997, pp. 152--161.
4. S. Patil and P. Banerjee , " Fault partitioning issues in an integrated parallel test generation/fault simulation environment," in Proceedings. 'Meeting the Tests of Time '., International Test Conference , 1989 , pp. 718 -- 726 . S. Patil and P. Banerjee, "Fault partitioning issues in an integrated parallel test generation/fault simulation environment," in Proceedings. 'Meeting the Tests of Time'., International Test Conference, 1989, pp. 718--726.