1. Fuzzing Embedded Systems using Debug Interfaces;Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis;2023-07-12
2. Debugger-driven Embedded Fuzzing;2022 IEEE Conference on Software Testing, Verification and Validation (ICST);2022-04
3. Better Late Than Never;Proceedings of the 28th International Symposium on High-Performance Parallel and Distributed Computing;2019-06-17
4. Mutation Testing-Based Test Suite Reduction Inspired from Warshall’s Algorithm;Advances in Intelligent Systems and Computing;2018-06-13
5. Software Product Line Test Suite Reduction with Constraint Optimization;Communications in Computer and Information Science;2017