Programming the Measurement System by using VEE Pro to Determine Cyclic I-V Characteristics: Resistive Switching Device Application

Author:

TEMEL Ersin1ORCID,AKKAYA Abdullah2ORCID

Affiliation:

1. GIRESUN UNIVERSITY

2. AHI EVRAN UNIVERSITY

Abstract

In this study we introduce a simple program for cyclic current–voltage (I–V) measurements for bipolar and unipolar resistive switching devices. This program (Cyclic I-V, CYC-IV) was developed under the Keysight VEE Pro (Visual Engineering Environment Program) software and has a graphical interface. CYC-IV was developed for programming the Keysight B2912 Precision Source/Measure Unit (SMU) for I-V measurement of resistive switching devices in sweep mode. CYC-IV can be used in six different sweep mode. Moreover, the ramp rate, upper and lower limits of bias, cycle delay time and number of cycles easily define by user. Measurement results were visualized in three graphs that can be viewed simultaneously with the measurements.

Publisher

Erzincan Universitesi Fen Bilimleri Ensitusu Dergisi

Subject

Microbiology

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