Inspection System for Tracing Defects of Optical Film Using Contact Image Sensor
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Published:2008-08-25
Issue:4
Volume:19
Page:310-314
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ISSN:1225-6285
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Container-title:Hankook Kwanghak Hoeji
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language:en
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Short-container-title:Hankook Kwanghak Hoeji
Author:
Rhee Hyug-Gyo,Jeon Byeong-Hyug,Lee Hoi-Yun,Lee Yun-Woo
Publisher
Korean Journal of Optics and Photonics
Subject
Industrial and Manufacturing Engineering,Environmental Engineering