Non-destructive testing of technological properties of wheat fl our using a portable spectrometer

Abstract

The work shows the potential of using portable UV-Vis-NIR spectrometers to control the technological properties of wheat fl our. UV-Vis-NIR spectra of 34 wheat fl our samples were obtained. The values of rheological properties of wheat fl our samples were obtained by means of a farinograph. Using the PCA-LDA method, three groups of samples differing in flour strength were formed. The accuracy of the resulting classification model was 96.49%. The values of the baking properties of wheat fl our samples were determined by means of an alveograph. The indicators of technological properties that make the greatest contribution to the gradation of samples into groups according to baking properties were identified.