Dependence of the radiative recombination lifetime upon electric field in silicon quantum dots embedded into SiO 2-Reference-Cited by-同舟云学术

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Dependence of the radiative recombination lifetime upon electric field in silicon quantum dots embedded into SiO 2

Published:2000-07-15 Issue:2 Volume:51 Page:168-173
ISSN:0295-5075
Container-title:Europhysics Letters (EPL)
language:
Short-container-title:Europhys. Lett.

Author:

Ouisse T,Nassiopoulou A. G

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

https://iopscience.iop.org/article/10.1209/epl/i2000-00527-x/pdf

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