Abstract
Abstract
Thermoelectric materials exhibit correlated transport of charge and heat. The Johnson-Nyquist noise formula 4k
B
T
R for the spectral density of voltage fluctuations accounts for fluctuations associated solely with Ohmic dissipation. Applying the fluctuation-dissipation theorem, we generalize the Johnson-Nyquist formula for thermoelectrics, finding an enhanced voltage fluctuation spectral density 4k
B
T
R(1 + Z
D
T) at frequencies below a thermal cut-off frequency f
T
, where Z
D
T is the dimensionless thermoelectric device figure of merit. The origin of the enhancement in voltage noise is thermoelectric coupling of temperature fluctuations. We use a wideband
, integrated thermoelectric micro-device to experimentally confirm our findings. Measuring the Z
D
T enhanced voltage noise, we experimentally resolve temperature fluctuations with a root mean square amplitude of
at a mean temperature of 295 K. We find that thermoelectric devices can be used for thermometry with sufficient resolution to measure the fundamental temperature fluctuations described by the fluctuation-dissipation theorem.
Funder
Canada Excellence Research Chairs, Government of Canada
Canada First Research Excellence Fund
Deutsche Forschungsgemeinschaft
Natural Sciences and Engineering Research Council of Canada
Subject
General Physics and Astronomy
Cited by
2 articles.
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