Determination of micrometer length scales with an X-ray reflection ultra small-angle scattering set-up-Reference-Cited by-同舟云学术

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Determination of micrometer length scales with an X-ray reflection ultra small-angle scattering set-up

Published:1998-06-01 Issue:5 Volume:42 Page:517-522
ISSN:0295-5075
Container-title:Europhysics Letters (EPL)
language:
Short-container-title:Europhys. Lett.

Author:

Müller-Buschbaum P,Casagrande M,Gutmann J,Kuhlmann T,Stamm M,Krosigk G. von,Lode U,Cunis S,Gehrke R

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

https://iopscience.iop.org/article/10.1209/epl/i1998-00282-0/pdf

Cited by 45 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Sub-Micrometer Structure Formation during Spin Coating Revealed by Time-Resolved In Situ Laser and X-Ray Scattering;Advanced Functional Materials;2017-09-12

3. How to make persistent micelle templates in 24 hours and know it using X-ray scattering;Journal of Materials Chemistry A;2017

4. Investigating Polymer–Metal Interfaces by Grazing Incidence Small-Angle X-Ray Scattering from Gradients to Real-Time Studies;Nanomaterials;2016-12-10

5. Achieving grazing-incidence ultra-small-angle X-ray scattering in a laboratory setup;Journal of Applied Crystallography;2015-03-12

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