Author:
Ren Haoxing,Puri Ruchir,Reddy Lakshmi,Krishnaswamy Smita,Washburn Cindy,Earl Joel,Keinert Joachim
Publisher
IEEE Conference Publications
Cited by
4 articles.
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1. Generation of Two-Cycle Tests for Structurally Similar Circuits;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2024-02
2. Test Generation for an Iterative Design Flow with RTL Changes;2022 IEEE International Test Conference (ITC);2022-09
3. Fast Test Generation for Structurally Similar Circuits;2022 IEEE 40th VLSI Test Symposium (VTS);2022-04-25
4. Logic Synthesis;Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology;2016-04-14