<i>Operando</i> Scanning Photoelectron Microscopy Analysis for Electronic Devices-Reference-Cited by-同舟云学术

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Operando Scanning Photoelectron Microscopy Analysis for Electronic Devices

Published:2016 Issue:1 Volume:37 Page:25-30
ISSN:0388-5321
Container-title:Hyomen Kagaku
language:en
Short-container-title:Journal of The Surface Science Society of Japan

Author:

NAGAMURA Naoka¹,HORIBA Koji²,OSHIMA Masaharu³

Affiliation:

1. National Institute for Materials Science

2. High Energy Accelerator Research Organization

3. Synchrotron Radiation Research Organization, The University of Tokyo

Publisher

Surface Science Society Japan

Subject

General Earth and Planetary Sciences,General Engineering,General Environmental Science

Link

https://www.jstage.jst.go.jp/article/jsssj/37/1/37_25/_pdf

Reference13 articles.

1. 1) M.A. Bañares: Catal. Today 100, 71 (2005).

2. 3) K. Horiba, Y. Nakamura, N. Nagamura, S. Toyoda, H. Kumigashira, M. Oshima, K. Amemiya, Y. Senba and H. Ohashi: Rev. Sci. Instrum. 82, 113701 (2011).

3. 4) S. Günther, B. Kaulich, L. Gregoratti and M. Kiskinova: Prog. Surf. Sci. 70, 187 (2002).

4. 5) N. Nagamura, K. Horiba, S. Toyoda, S. Kurosumi, T. Shinohara, M. Oshima, H. Fukidome, M. Suemitsu, K. Nagashio and A. Toriumi: Appl. Phys. Lett. 102, 241604 (2013).

5. 6) K. Nagashio, T. Yamashita, T. Nishimura, K. Kita and A. Toriumi: J. Appl. Phys. 110, 024513 (2011).

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