Nano-scale Surface and Interface Analysis Using X-ray Spectromicroscopy Assisted by Measurement Informatics-Reference-Cited by-同舟云学术

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Nano-scale Surface and Interface Analysis Using X-ray Spectromicroscopy Assisted by Measurement Informatics

Published:2021-08-10 Issue:8 Volume:64 Page:382-389
ISSN:2433-5835
Container-title:Vacuum and Surface Science
language:en
Short-container-title:Vac. Surf. Sci.

Author:

NAGAMURA Naoka¹,MATSUMURA Tarojiro²,NAGATA Kenji³,AKAHO Shotaro⁴,ANDO Yasunobu²

Affiliation:

1. RCAMC, National Institute for Materials Science

2. CD-FMat, National Institute of Industrial Science and Technology

3. MaDIS, National Institute for Materials Science

4. HIIRI, National Institute of Industrial Science and Technology

Publisher

Surface Science Society Japan

Link

https://www.jstage.jst.go.jp/article/vss/64/8/64_20180762/_pdf

Reference25 articles.

1. 1) M. Shiga, K. Tatsumi, S. Muto, K. Tsuda, Y. Yamamoto, T. Mori and T. Tanji : Ultramicroscopy 170, 43 (2016).

2. 2) W. Li, K.G. Field and D. Morgan : npj Comput. Mater. 4, 36 (2018).

3. 3) B.R. Jany, A. Janas and F. Krok : Nano Lett. 17, 6520 (2017).

4. 4) I. Arganda-Carreras, V. Kaynig, C. Rueden, K.W. Eliceiri, J. Schindelin, A. Cardona and H.S. Seung : Bioinformatics 33, 2424 (2017).

5. 5) M.G. Madden and T. Howley : “Applications and Innovations in Intelligent Systems XVI”, ed. by T. Allen, R. Ellis and M. Petridis (Springer, London, 2009) p. 77.

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1. Let's Start Diversity Promotion in Journal VSS;Vacuum and Surface Science;2022-05-10

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