Structural Studies of Electrode Surfaces using In Situ Surface X-ray Scattering Technique-Reference-Cited by-同舟云学术

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Structural Studies of Electrode Surfaces using In Situ Surface X-ray Scattering Technique

Published:2006 Issue:10 Volume:27 Page:586-590
ISSN:0388-5321
Container-title:Hyomen Kagaku
language:en
Short-container-title:Journal of The Surface Science Society of Japan

Author:

KONDO Toshihiro¹

Affiliation:

1. Department of Chemistry, Faculty of Science, Ochanomizu University

Publisher

Surface Science Society Japan

Subject

General Earth and Planetary Sciences,General Engineering,General Environmental Science

Link

http://www.jstage.jst.go.jp/article/jsssj/27/10/27_10_586/_pdf

Reference21 articles.

1. 1) 井口洋夫:“シンクロトロン軌道放射光” 市村禎二郎,旗野嘉彦,井口洋夫編 (学会出版センター,1991).

2. 2) H.D. Abrunã: “Electrochemical Interfaces: Modern Techniques for In Situ Interfacial Characterization” (VCH Publishers, Inc., New York, 1991).

3. 3) M.F. Toney and J. McBreen: Interface (The Electrochemical Society, Spring, 1993) p. 23.

4. 4) 近藤敏啓,魚崎浩平:表面 33, 580 (1995).

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 10.4139/sfj.58.517;Journal of The Surface Finishing Society of Japan;2007

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