Recent Development and Application of LEEM/PEEM. Observations of Ultra-thin Organic Films by MEEM and PEEM.-Reference-Cited by-同舟云学术

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Recent Development and Application of LEEM/PEEM. Observations of Ultra-thin Organic Films by MEEM and PEEM.

Published:2002 Issue:5 Volume:23 Page:292-299
ISSN:0388-5321
Container-title:Hyomen Kagaku
language:en
Short-container-title:Journal of The Surface Science Society of Japan

Author:

YASUFUKU Hideyuki¹,UENO Nobuo¹

Affiliation:

1. Department of Material Technology, Faculty of Engineering, Chiba University

Publisher

Surface Science Society Japan

Subject

General Earth and Planetary Sciences,General Engineering,General Environmental Science

Link

http://www.jstage.jst.go.jp/article/jsssj/23/5/23_5_292/_pdf

Reference33 articles.

1. Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy

2. Emission microscopy and surface science

3. Bibliography on emission microscopy, mirror electron microscopy, low-energy electron microscopy and related techniques: 1985–1991

4. Emission microscopy and related techniques: Resolution in photoelectron microscopy, low energy electron microscopy and mirror electron microscopy

5. 5) E. Bauer: Surf. Sci. 299/300, 102 (1994).

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 10.3131/jvsj.48.415;Shinku;2005

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