Tip-induced band bending and its effect on local barrier height measurement studied by light-modulated scanning tunneling spectroscopy-Reference-Cited by-同舟云学术

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Tip-induced band bending and its effect on local barrier height measurement studied by light-modulated scanning tunneling spectroscopy

Published:2006 Issue: Volume:4 Page:192-196
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Yoshida Shoji¹,Kikuchi Junichi¹,Kanitani Yuya¹,Takeuchi Osamu¹,Oigawa Haruhiro¹,Shigekawa Hidemi¹

Affiliation:

1. Institute of Applied Physics, COE, CREST-JST, University of Tsukuba, Japan

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

http://www.jstage.jst.go.jp/article/ejssnt/4/0/4_0_192/_pdf

Reference10 articles.

1. Surface Electronic Structure of Si (111)-(7×7) Resolved in Real Space

2. Capacitance of a molecular overlayer on the silicon surface measured by scanning tunneling microscopy

3. Local-barrier-height images ofTiO2(110)surfaces

4. Theoretical Analysis of Apparent Barrier Height on an Al Surface: Difference by Measurement Methods

5. Probe effect in scanning tunneling microscopy onSi(001)low-temperature phases

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