Thickness Determination of Graphene Layers Formed on SiC Using Low-Energy Electron Microscopy-Reference-Cited by-同舟云学术

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Thickness Determination of Graphene Layers Formed on SiC Using Low-Energy Electron Microscopy

Published:2008 Issue: Volume:6 Page:107-110
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Hibino H.¹,Kageshima H.¹,Maeda F.¹,Nagase M.¹,Kobayashi Y.¹,Kobayashi Y.¹,Yamaguchi H.¹

Affiliation:

1. NTT Basic Research Laboratories, NTT Corporation, Japan

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

http://www.jstage.jst.go.jp/article/ejssnt/6/0/6_0_107/_pdf

Reference15 articles.

1. Electric Field Effect in Atomically Thin Carbon Films

2. Two-dimensional gas of massless Dirac fermions in graphene

3. Experimental observation of the quantum Hall effect and Berry's phase in graphene

4. [4] A. J. van Bommel, J. E. Crombeen, and A. van Tooren, Surf. Sci. 48, 463 (1975).

5. Heteroepitaxial graphite on6H−SiC(0001): Interface formation through conduction-band electronic structure

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