Fast Phase Retrieval from Reflection High Energy Electron Diffraction Intensities during Growth-Reference-Cited by-同舟云学术

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Fast Phase Retrieval from Reflection High Energy Electron Diffraction Intensities during Growth

Published:2018 Issue:0 Volume:16 Page:97-100
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotech.

Author:

Kawamura Takaaki¹

Affiliation:

1. Surface and Vacuum Physics, Institute of Industrial Science, University of Tokyo

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

https://www.jstage.jst.go.jp/article/ejssnt/16/0/16_97/_pdf

Reference10 articles.

1. [1] J. H. Neave, B. A. Joyce, P. J. Dobson, and N. Norton, Appl. Phys. A 31, 1 (1983). https://doi.org/10.1007/BF00617180

2. [2] C. S. Lent and P. I. Cohen, Surf. Sci. 139, 121 (1984). https://doi.org/10.1016/0039-6028(84)90013-X

3. [3] T. Kawamura, P. A. Maksym, and T. Iijima, Surf. Sci. 148, L671 (1984). https://doi.org/10.1016/0039-6028(84)90574-0

4. [4] T. Kawamura and P. A. Maksym, Surf. Sci. 161, 12 (1985). https://doi.org/10.1016/0039-6028(85)90724-1

5. [5] T. Kawamura, Surf. Sci. 351, 129 (1996). https://doi.org/10.1016/0039-6028(95)01262-1

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