Nanoscale Characterization of an Electron Emitting Tip by Scanning Probe Microscopy-Reference-Cited by-同舟云学术

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Nanoscale Characterization of an Electron Emitting Tip by Scanning Probe Microscopy

Published:2014 Issue:0 Volume:12 Page:377-379
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Watanabe Norimichi¹,Tanaka Miyuki¹,Shimizu Tetsuo¹

Affiliation:

1. Nanosystem Research Institute, National Institute of Advanced Industrial Science and Technology

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

https://www.jstage.jst.go.jp/article/ejssnt/12/0/12_377/_pdf

Reference17 articles.

1. [1] R. A. Collins and B. H. Blott, Surf. Sci. 10, 349 (1968).

2. [2] J. Pelleg and R. Liu, Thin Solid Films 221, 318 (1992).

3. [3] L. W. Swanson and N. A. Martin, J. Appl. Phys. 46, 2029 (1975).

4. [4] L. R. Danielson and L. W. Swanson, Surf. Sci. 88, 14 (1979).

5. [5] P. R. Davis, Surf. Sci. 91, 385 (1980).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanoscale characterization of an electron emitting tip by field emission microscopy and scanning probe microscopy;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2015-09

2. Characterization of an Electron Emitting Tip by Field Emission Microscope and Scanning Probe Microscope;Journal of the Vacuum Society of Japan;2015

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