Properties of Amorphous Transparent Conductive In-Ga-Zn Oxide Films Deposited on Fused Quartz by the PLD Method-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Properties of Amorphous Transparent Conductive In-Ga-Zn Oxide Films Deposited on Fused Quartz by the PLD Method

Published:2009 Issue: Volume:7 Page:273-276
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Tominaga Kikuo¹,Tsuzuki Takashi¹,Maruyama Takayuki¹,Mikawa Michio²,Moriga Toshihiro¹

Affiliation:

1. Institute of Socio-Techno Science Technology, University of Tokushima, Japan

2. Takuma National College of Technology, Japan

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

http://www.jstage.jst.go.jp/article/ejssnt/7/0/7_0_273/_pdf

Reference13 articles.

1. Electrical properties of vacuum-deposited indium oxide and indium tin oxide films

2. [2] S. Ishibashi, Y. Higuchi, Y. Ota, and K. Nakamura, J. Vac. Sci. Technol. A 8, 1403 (1990).

3. Structural, electrical and optical properties of r.f.-magnetron-sputtered SnO2:Sb film

4. Highly Conductive and Transparent Aluminum Doped Zinc Oxide Thin Films Prepared by RF Magnetron Sputtering

5. Crystallinity of Gallium-Doped Zinc Oxide Films Deposited by DC Magnetron Sputtering Using Ar, Ne or Kr Gas

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Solid‐State Optoelectronic Synapse Transistor Using a LaF ₃ Gate Dielectric;physica status solidi (RRL) – Rapid Research Letters;2022-08-18

2. Evolution of microstructure of IGZO ceramic target during magnetron sputtering;Ceramics International;2021-11

3. Sol-Jel Yöntemiyle IGZO Partiküllerin Üretimi, Peletlenmesi ve Karakterizasyonu;Journal of Polytechnic;2020-05-22

4. X-ray Diffraction, XPS, and Raman Spectroscopy of Coated ZnO:Al (1—7 at%) Nanoparticles;e-Journal of Surface Science and Nanotechnology;2019-10-24

5. Preparation of IGZO sputtering target and its applications to thin-film transistor devices;Ceramics International;2012-07

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号京ICP备18003416号-3