Auger Intensity Anomalies from ZnO(0001) Surface Excited by RHEED Incident Beam
Author:
Affiliation:
1. Department of Electrical and Electronic Engineering, Daido University
2. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University
3. Department of Electrical and Electronic Engineering, Nagoya Institute of Technology
Publisher
Surface Science Society Japan
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology
Link
https://www.jstage.jst.go.jp/article/ejssnt/14/0/14_92/_pdf
Reference15 articles.
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3. [3] S. Hong, T. Hanada, H. Ko, Y. Chen, T. Yao, D. Imai, K. Araki, M. Shinohara, K. Saitoh, and M. Terauchi, Phys. Rev. B 65, 115331 (2002).
4. [4] H. Tampo, P. Fons, A. Yamada, K. Kim, H. Shibata, K. Matsubara, S. Niki, H. Yoshikawa, and H. Kanie, Appl. Phys. Lett. 87, 141904 (2005).
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