Field Emission from W Tips Sharpened by Field-Assisted Nitrogen and Oxygen Etching-Reference-Cited by-同舟云学术

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Field Emission from W Tips Sharpened by Field-Assisted Nitrogen and Oxygen Etching

Published:2008 Issue: Volume:6 Page:152-156
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotechnol.

Author:

Onoda Jo¹,Rahman Faridur¹,Mizuno Seigi¹

Affiliation:

1. Department of Molecular and Material Sciences, Kyushu University, Japan

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Link

http://www.jstage.jst.go.jp/article/ejssnt/6/0/6_0_152/_pdf

Reference18 articles.

1. Mono-atomic tips for scanning tunneling microscopy

2. Point source for ions and electrons

3. Atomic metallic ion emission, field surface melting and scanning tunneling microscopy tips

4. Field-emission electron spectroscopy of single-atom tips

5. [5] K. Nagaoka, H. Fujii, K. Matsuda, M. Komaki, Y. Murata, C. Oshima, and T. Sakurai, Appl. Surf. Sci. 182, 12 (2001).

Cited by 11 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Field Assisted Reactive Gas Etching of Multiple Tips Observed using FIM;Ultramicroscopy;2021-04

2. Development of LEED Apparatus Using Nano-Tips Fabricated by Field-Assisted Etching;e-Journal of Surface Science and Nanotechnology;2012

3. Fabrication of <110> oriented tungsten nano-tips by field-assisted water etching;Applied Surface Science;2011-08

4. Fabrication of Gas Field Ion Emitter by Field Induced Oxygen Etching Method;e-Journal of Surface Science and Nanotechnology;2011

5. Stability Measurement of Ion Beam Current from Argon Field Ion Source;e-Journal of Surface Science and Nanotechnology;2011

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