Advantages of Transition-Edge Sensor Combined with Low Voltage SEM in Surface Analysis
Author:
Affiliation:
1. Steel Research Laboratory, JFE Steel Corporation
2. SII NanoTechnology Inc.
Publisher
Surface Science Society Japan
Subject
General Earth and Planetary Sciences,General Engineering,General Environmental Science
Link
http://www.jstage.jst.go.jp/article/jsssj/31/11/31_11_610/_pdf
Reference21 articles.
1. 1) H. Drescher, L. Reimer and H. Seidel: Z. Angew Phys. 29, 331 (1970).
2. 2) J.I. Goldstein, D.E. Newbury, P. Echlin, D.C. Joy, C. Fiori and E. Lifshin: “Scanning Electron Microscopy and X-Ray Microanalysis”, (PLENUM PRESS, New York, 1981) pp. 88-92.
3. 3) L. Reimer: “Image Formation in Low-Voltage Scanning Electron Microscopy” (Bellingham, Washington USA, SPIE Optical Engineering Press, 1993) pp. 1-3, pp. 12-13.
4. Solid surface observation at very low accelerating voltage (200V–1kV) by scanning electron microscope
5. 5) “走査電子顕微鏡の基礎と応用” 日本電子顕微鏡学会関東支部編 (共立出版,1983) pp. 58-60, pp. 469-470.
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1. Low-Voltage Scanning Electron Microscopy as a Tool for Surface Imaging and Analysis of Practical Materials;Journal of Surface Analysis;2017
2. Electron Microscopic Techniques for Surface Analysis of Steel Products;Zairyo-to-Kankyo;2015
3. Transition Edge Sensor (TES) X-Ray Detecting System with Sensitivity Correction to Stabilize the Spectrum Peak Center;Key Engineering Materials;2014-06
4. The Continuing Challenge of Steel: How to Win Mathematicians and Influence Scientists in Other Disciplines;The Impact of Applications on Mathematics;2014
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