Data reduction and uncertainty assessment of the direct pulse heating technique with both contact and radiance temperature measurements

Abstract

This work presents a data reduction procedure of the direct pulse heating technique with both contact and radiance temperature measurements. The technique is applied for the measurement of thermophysical properties of electroconductive solids over a wide temperature range, i.e., from room temperature up to about 2300°C. Absolute and radiance temperatures of a tested material are measured by thermocouple and radiation thermometer, respectively and these and other experimental data are then reduced to the values of specific heat, specific electrical resistivity, hemispherical total emissivity and normal spectral emissivity of the tested material. The related data reduction and corresponding uncertainty assessment for each property is described in detail. An example of uncertainty assessment is given for the recent measurement of specific heat, specific electrical resistivity, hemispherical total emissivity and normal spectral emissivity at 900 nm of molybdenum alloy TZM specimens.