CMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applications-Reference-Cited by-同舟云学术

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CMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applications

Published:1995-01 Issue:1.2 Volume:39 Page:229-244
ISSN:0018-8646
Container-title:IBM Journal of Research and Development
language:
Short-container-title:IBM J. Res. & Dev.

Author:

Shahidi G. G.,Warnock J. D.,Comfort J.,Fischer S.,McFarland P. A.,Acovic A.,Chappell T. I.,Chappell B. A.,Ning T. H.,Anderson C. J.,Dennard R. H.,Sun J. Y.-C.,Polcari M. R.,Davari B.

Publisher

IBM

Subject

General Computer Science

Link

http://xplorestaging.ieee.org/ielx5/5288520/5389502/05389522.pdf?arnumber=5389522

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